a)
The FT/IR-4000 Series:
Robust, High Sensitivity FT-IR Systems for Education and Routine Analysis
Higher Signal-to-Noise Ratio than Competitive Systems
Easy, Single Step Analysis and Data Processing
IR Imaging with Multichannel Microscope and Rapid Scan Option
The new Jasco FT/IR-4100 and FT/IR-4200 were designed to provide operational
features and sensitivity levels found only in more expensive instruments.
The innovative technology incorporated in these instruments results
in exceptionally high signal-to-noise ratio specifications. Both models
offer exceptional flexibility and can be easily upgraded to meet new
requirements. Optional expandability includes microanalysis with an
IR microscope, IR imaging with a multichannel microscope, and rapid
scan option. The Jasco Quick Start System enables users of all experience
levels to measure samples and perform data processing functions quickly
and easily with a simple push of a button.
b) The FT/IR-6000 Series:
High Performance FT-IR with the Highest Signal-to-Noise Ratio Available
S/N Ratio 50,000: 1 with 0.07 cm-1 resolution
Gold Optical Surfaces for enhanced FT-Raman Measurements
IR Imaging, Step Scan and Full Vacuum Options Available
The new Jasco FT/IR-6100, FT/IR-6200, and FT/IR-6300 offer the absolute
highest level of performance in the industry with the highest signal-to-noise
specifications. Designed for a wide range of critical research and development
applications, each model is capable of measuring from the Near IR (15000
cm-1) to the Far IR (50 cm-1).
The FT/IR-6300 is equipped with gold optical surfaces for more efficient
FT-Raman analysis and rapid scan capability as standard. Step scan,
high resolution, and full vacuum options are available for all models.
c)
Microscope/IR Imaging for FTIR (Model IMV 4000 and IRT 3000)
FT-IR microscope
combines a light microscope with a FT-IR spectrometer thus providing
a very powerful technique of measuring spectra. It enables the acquisition
of spectra with spatial resolution in the micrometer range, where an
IR spectrum reflects the overall composition of the sample.
FT-IR imaging
utilizes a linear array detector in a new and promising technique for
2-D sample analysis. In contrast to conventional FT-IR microscopy, the
FT-IR imaging allows the simultaneous collection of spectra enabling
rapid spectroscopic and spatial discrimination of a sample area.
JASCO offers
two infrared microscope models which can be easily interfaced to any
FT/IR-4000 or FT/IR-6000 instrument.
|
