PIKE
Technologies PRODUCTS |
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Attenuated
Total Reflectance (ATR)
Successfully replaces constant path transmission cells
and salt plates used for yses of liquid and semi-liquid materials.
ATR can be used to yze films, pastes, pliable solids and fine
powders. Thanks to the reproducible effective pathlength, it is
well suited for both, qualitative and quantitative applications.
Single and multiple reflection and variable and fixed angle of
incidence products are available. |
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Transmission
Products
A wide selection of transmission accessories, sample
preparation tools, IR materials, windows and crystals is displayed
in this section. Automated accessories for transmission ysis increase
sample throughput. Included are: gas, liquid and mull cells; dies
and KBr presses; cell holders and consumables. |
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Diffuse
Reflectance Products
This technique offers an efficient way of collecting
spectra of powders and other solid materials. Although sample
preparation involves its grinding with KBr, no pellet pressing
is required. The powder it is simply placed into the sample cup
and yzed. Among others, diffuse reflectance accessories are ideal
for pharmaceutical and forensic applications. Automated versions
speed ysis. |
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Specular
Reflectance
An elegant method of measuring spectra of films and other
materials deposited on, or pressed against reflective surfaces.
This technique is used for non-destructive testing of lubricated
surfaces of hard disks, to degradation studies of a protective
coating on the surface of the Air Force jet; ysis of polymers
on the surface of food containers and many others. |
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Integrating
Spheres
Provide the ability to collect integrated reflectance
or diffuse transmission spectra from scattering samples. Applications
include spectral identification of materials, quantitative ysis
of heterogeneous samples and absolute reflectance. |
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Special
Applications
FTIR spectroscopy is instrumental in determining several
components of semiconductor wafers. ysis of Borophosphsilicate Glass
(BPSG) as well as Carbon and Oxygen content can be performed in
FTIR transmission experiments. EPI - Epitaxial Layer Thickness is
determined by reflectance measurements. |
